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GWC
Technologies |
505
S. Rosa Rd
Madison, WI 53719
USA |
| 608.441.2726 |
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| PM-IRRAS |
Traditional
IRRAS
FT-IR spectroscopy
combined with reflectance analysis can provide information on
chemical structure and molecular orientation of monolayers and
other thin films on conductive metal surfaces. As
originally developed, such “Infra-red reflectance-absorbance
spectroscopy” (IRRAS) analysis may be compromised by
poor sensitivity, among other concerns. |
 Improved
PM-IRRAS
To address
the limitations of standard IRRAS measurements, GWC developed
the Synchronous Sampling Demodulators (SSDs), which serve as
key components of the improved method of Polarization-Modulation
IRRAS (PM-IRRAS). At the grazing incident angles used for reflectivity
measurements, the p-polarized intensity is enhanced so that
the differential signal produced by polarization modulation
can be demodulated to allow the observation of sub-monolayer
quantities of adsorbed chemical species. The
chart above illustrates typical data analysis of a thin polymer
film. The peak structure of the reflectance curve indicates
chemical structure, and the amplitude of the peaks indicate
film thickness. |
Background
information on PMIRRAS
For more information about how PMIRRAS
works, please refer to the SSD manual
(coming soon) or contact
. |
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©2008
GWC Technologies
Contact our
with any questions or comments. |
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