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GWC
Technologies |
505
S. Rosa Rd
Madison, WI 53719
USA |
| 608.441.2726 |
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SURFACE CHARACTERIZATION
If you want to evaluate the chemical
composition of thin layers on metal surfaces, you can perform
reflectivity measurements using your FT-IR spectrometer (“IRRAS”,
or infra-red reflection absorption spectroscopy). Information
available from IRRAS measurements can be maximized by measuring
the reflectivity signals for p-polarized light rather
than the standard method of using the native FT-IR signals,
which include both p and s-polarized moieties.
GWC’s synchronous sampling demodulators (SSDs) in conjunction
with a Hinds photoelastic modulator provide the means to achieve
Polarization Modulation of the reflected light, so you can focus
on p-polarized signals. This “PM-IRRAS”
method is now widely used to enhance reflectivity measurements.
PM-IRRAS
can be used for:
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- Observation of sub-monolayer quantities of adsorbed chemical
species
- Development and testing of coatings
- Development and testing of new surface chemistries for
array fabrication.
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©2008
GWC Technologies
Contact our
with any questions or comments. |
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